2025 (Current Year) Faculty Courses School of Science Department of Physics Graduate major in Physics
Advanced Special Topics in Physics XII
- Academic unit or major
- Graduate major in Physics
- Instructor(s)
- Xiuzhen Yu
- Class Format
- Lecture
- Media-enhanced courses
- -
- Day of week/Period
(Classrooms) - Class
- -
- Course Code
- PHY.P693
- Number of credits
- 100
- Course offered
- 2025
- Offered quarter
- 3Q
- Syllabus updated
- May 29, 2025
- Language
- English
Syllabus
Course overview and goals
The electron microscope is an indispensable tool for the advancement of science and technology, as it enables visualization of the nanoscopic world. It contributes extensively to the understanding of condensed matter physics, the development of advanced materials, and applications in nanotechnology. In particular, advancements in cryo-electron microscopy and time-resolved electron microscopy have significantly impacted the elucidation of quantum phenomena. This course aims to provide students with exposure to and a deeper understanding of state-of-the-art evaluation techniques in physics research.
Course description and aims
In the lecture, students will learn about the geometric optics of electron beams, the interaction between electrons and matter, scanning electron microscopy (SEM), transmission electron microscopy (TEM), advanced electron microscopy techniques, measurements of emergent quantum properties, and next-generation microscopy technologies. By engaging with these topics, students will deepen their understanding of cutting-edge evaluation techniques in physics research.
Keywords
Advanced electron microscopy
Competencies
- Specialist skills
- Intercultural skills
- Communication skills
- Critical thinking skills
- Practical and/or problem-solving skills
Class flow
Starting with the basics of electron microscopy, we will introduce scanning electron microscopy (SEM), transmission electron microscopy (TEM), advanced electron microscopy techniques, the development of measurements of emergent quantum properties, and the outlook for future microscopic measurements.
Course schedule/Objectives
| Course schedule | Objectives | |
|---|---|---|
| Class 1 | Geometric optics of electron beams | It will be given in the lecture |
| Class 2 | Interaction between electrons and matter | It will be given in the lecture |
| Class 3 | Scanning electron microscopy | It will be given in the lecture |
| Class 4 | Transmission electron microscopy | It will be given in the lecture |
| Class 5 | Advanced electron microscopies | It will be given in the lecture |
| Class 6 | Characterizations of emergent quantum properties | It will be given in the lecture |
| Class 7 | The next-generation microscopies | It will be given in the lecture |
Study advice (preparation and review)
To enhance effective learning, students are encouraged to spend approximately 100 minutes preparing for class and another 100 minutes reviewing class content afterwards (including assignments) for each class.
They should do so by referring to textbooks and other course material.
Textbook(s)
Not specified
Reference books, course materials, etc.
Ludwing Reimer "Transmission Electron Microscopy", 5th edition, Springer
Stephen J. Pennycook, Peter D. Nellist " Scanning Transmission Electron Microscopy: Imaging and analysis", Springer (2011)
Evaluation methods and criteria
Based on a term paper
Related courses
- PHY. P593
Prerequisites
No specified
Contact information (e-mail and phone) Notice : Please replace from ”[at]” to ”@”(half-width character).
yu_x[at]riken.jp
Office hours
15:15-17:15